The number of touchpoints between analog and digital circuits in high performance SoCs is increasing. This is not a problem because it is possible to implement critical analog blocks directly on nanometer scale digital ICs. However, in many cases digital interfaces or digital feedback circuitry configures these analog blocks… Read More
Traditional logic testing relies on blasting pattern after pattern at the inputs, trying to exercise combinations to shake faults out of logic and hopefully have them manifested at an observable pin, be it a test point or a final output stage. It’s a remarkably inefficient process with a lot of randomness and luck involved.
Getting… Read More