Webinar: Accelerate time to success using smart methods for DFT chip architecture and validation

Online

Combining market-leading design-for-test (DFT) technologies with best-in-class netlist synthesis allows you to achieve DFT success more quickly. Many customers, including those for emulation and IC test, have challenges with scaling architectures. This webinar describes how Siemens emulation and silicon test solutions can work together to provide a smart DFT plug-and-play architecture for Veloce ICs. The …

Webinar: AI-Driven 3D System Analysis & Optimization for EM Antenna/RF Problems

Online

Antenna/RF design problems often involve the optimization of many variables, requiring numerous evaluations (EM simulations) using traditional optimization methods. Design engineers need an intelligent, accurate, and easy-to-use simulation platform and analysis solution that reduces repetitive design cycles while increasing user productivity and efficiency. Leveraging an advanced AI-enabled methodology, Optimality Explorer delivers quality results leading to …