All members of the design and test community are invited to register to attend Synopsys’ 30th Annual Test & SLM Special Interest Group (SIG) at the 2024 International Test Conference (ITC). …
Overview Learn the latest on Synopsys’ optical scattering measurement solutions. During the event, you will have the opportunity to network with Synopsys experts, listen to technical talks, and see several …
Continue reading "Optical Scattering Measurements and Instruments Info Day"
With the increasing complexity and importance of memories in modern ICs, there is a clear need for specialized tools and techniques for the design and verification of embedded memory blocks. Traditional methods like SPICE simulation and cell-based formal verification have limitations; SPICE offers circuit-level accuracy but limited coverage, while cell-based methods can't fully represent transistor-level …
With the increasing complexity and importance of memories in modern ICs, there is a clear need for specialized tools and techniques for the design and verification of embedded memory blocks. …
The semiconductor industry is rapidly adopting 2.5D and 3D multi-die designs as the significant benefits have become clear for applications like HPC, GPU, mobile, and AI/ML. Multi-die design technology has …
Continue reading "Ansys-Synopsys Technology Update: The Latest Advances in Multi-Die Design"
Learn, Network, and Accelerate Optical Design Innovation For this year’s event, we are excited to be discussing the latest in optical design and simulation, including topics on image simulation with …
Connecting the Synopsys User Community SNUG conferences have connected Synopsys global users for more than three decades. SNUG 2025 will once again provide a place where users and technical experts can meet, network, and share ideas about chip and system design. REGISTER HERE
