SEMICON West 2025

SEMICON West 2025 makes its debut in Phoenix, October 7–9—positioning the city as a key hub for innovation and industry growth. This milestone event gathers global leaders across the microelectronics …

RISC-V Summit North America 2025

Santa Clara Convention Center Santa Clara Convention Center, 5001 Great America Pkwy, Santa Clara, CA, United States

RISC-V is defining the future of open computing by providing unprecedented freedom to innovate. More than 13 billion RISC-V cores have shipped, powering new innovations in AI/ML, wireless, automotive, data …

ICCAD 2025

The 2025 International Conference on Computer-Aided Design Call For Papers Jointly sponsored by IEEE and ACM, IEEE ICCAD is the premier forum to explore new challenges, present leading-edge innovative solutions, …

Electronic Packaging Days 2025

Fraunhofer Institute for Reliability and Microintegration IZM Gustav-Meyer-Allee 25, Building 17/3, Berlin, Germany

On 6 and 7 November, Fraunhofer IZM is inviting customers and partners from industry to Berlin for its “Electronic Packaging Days”. The event is designed to facilitate direct exchange between …

SemIsrael Expo 2025

Connecting the Dots: Empowering the Semiconductor Community SemIsrael Expo 2025 is the premier professional semiconductor event in Israel. The event brings together hundreds of Israeli semiconductor professionals from all fields …

SC25

The International Conference for High Performance Computing, Networking, Storage, and Analysis HPC Ignites. St. Louis is the place to be this fall as the high performance computing community convenes for …

SEMICON Europa 2025

SEMICON Europa 2025 is co-located with productronica and will take place in November 18-21, 2025 in Munich, Germany. This year’s theme Global Collaborations for European Economic Resilience expresses that global collaborations are not …

Semitracks Course: Defect-Based Testing

Munich, Germany Munich, Germany

Semiconductor and integrated circuit developments continue to proceed at an incredible pace. For example, today's application-specific ICs and microprocessors can contain upwards of 100 million transistors. Traditional testing relies on the stuck-at-fault (SAF) to model defect behavior. Unfortunately, the SAF model is a poor model for defects. Other models and strategies are required to catch …