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ABOUT PAINE Physical inspection of electronics has grown significantly over the past decade and is becoming a major focus for the chip designers, original equipment manufacturers, and system developers. The complex long life of the electronic devices coupled with their diverse applications is making them increasingly vulnerable to various forms of threats and inspection. Large …
The IEEE/ACM International Symposium on Microarchitecture® is the premier forum for presenting, discussing, and debating innovative microarchitecture ideas and techniques for advanced computing and communication systems. This symposium brings together researchers in …
Achieving Timing Closure in FPGA Designs Workshop Do you find it challenging to close timing in your FPGA design? This workshop will guide you through leveraging AMD Vivado’s tools, optimizing your design, …
Description BLT, an AMD Premier Design Services Partner and Authorized Training Provider, presents this webinar. Unlock the potential of the AMD Kria SOM and discover Time-Sensitive Networking (TSN) benefits for your applications. In this session, you’ll explore the TSN-ROS application and its role in enhancing communications within a TSN framework. Join our hands-on demonstration to …
Semiconductor and integrated circuit developments continue to proceed at an incredible pace. The industry as a whole has gotten to this point of incredible complexity through the process of countless …
As the global semiconductor landscape continues to evolve, Vietnam is positioning itself for a promising future in the semiconductor industry. SEMIEXPO Vietnam will be a pivotal event, exploring opportunities for …
Connecting the Dots: Empowering the Semiconductor Community SemIsrael Expo 2025 is the premier professional semiconductor event in Israel. The event brings together hundreds of Israeli semiconductor professionals from all fields …
Amsterdam Marriott Hotel
Stadhouderskade 12, Amsterdam, Netherlands
The Netherlands has been the home for Hardwear.io since 2015. We are very excited to host the industry from automotive, healthcare, semiconductor, IoT, industrial control systems and Govt/Defences Institutes to …
ICM – International Congress Center Messe München
Messe München GmbH, Messegelände, München, Germany
Discover how the latest MEMS and imaging technologies are enabling next-level value creation across industries. Explore cutting-edge AI-enhanced sensing, data fusion, and their transformative impact on automotive, healthcare, and smart …
From Theory to Practice: Applying Timing Constraints Workshop Do you struggle to identify which constraints are needed for a design or how to properly input them? This workshop will cover …
Signia by Hilton San Jose
170 S Market St, San Jose, CA, United States
Date: Nov. 20, 2025 Time: SIA Reception at 5:00 pm Dinner, Awards Presentations, & Keynote Remarks at 6:30 pm After-Dinner Reception at 8:30 pm Location: Signia by Hilton San Jose …
Description Clock domain crossings (CDCs) are a critical aspect of FPGA and embedded system design, and handling them correctly is essential for reliable operation. In this one-hour webinar, we’ll break down CDC fundamentals, explore best practices for managing single-bit and bus CDCs, and demonstrate how to leverage Xilinx Parameterized Macros (XPM) for seamless synchronization. Join …
100 YEARS of FETs: SHAPING the FUTURE of DEVICE INNOVATIONS Inside IEEE IEDM 2025 Focus Sessions Focus Session #1 - Efficient AI Solutions: Architecture, Circuit, and 3D Integration Innovations for Memory and Logic Focus Session #2 - Beyond Silicon: The Invisible Revolution in Thin-Film Transistors Focus Session #3 - From P-bits to Qubits: Classical, Quantum-Inspired …
Essential Debugging Techniques Workshop This workshop is for hardware engineers, system architects, and anyone who wants to learn best practices for debugging challenging issues encountered while developing FPGAs, SoCs, PCBs, …
Semiconductor and integrated circuit developments continue to proceed at an incredible pace. For example, today's application-specific ICs and microprocessors can contain upwards of 100 million transistors. Traditional testing relies on …
Semiconductor and integrated circuit developments continue to proceed at an incredible pace. The industry as a whole has gotten to this point of incredible complexity through the process of countless …
Failure and Yield Analysis is an increasingly difficult and complex process. Today, engineers are required to locate defects on complex integrated circuits. In many ways, this is akin to locating …
Product reliability and qualification continues to evolve with the electronics industry. New electronics applications require new approaches to reliability and qualification. In the past, reliability meant discovering, characterizing and modeling …
Electrical Overstress (EOS) and Electrostatic Discharge (ESD) account for most of the field failures observed in the electronics industry. Although EOS and ESD damage can at times look quite similar …
