SoC test challenges arise due to the complexity and diversity of the functional blocks integrated into the chip. As SoCs become more complex, it becomes increasingly difficult to access all of the functional blocks within the chip for testing. SoCs also can contain billions of transistors, making it extremely time-consuming… Read More
Using ML for Statistical Circuit Verification
I’ve been following Solido as a start-up EDA vendor since 2005, then they were acquired by Siemens in 2017. At the recent User2User event there was a presentation by Kwonchil Kang, of Samsung Electronics on the topic, ML-enabled Statistical Circuit Verification Methodology using Solido. For high reliability circuits… Read More
Achieving Optimal PPA at Placement and Carrying it Through to Signoff
Performance, Power and Area (PPA) metrics are the driving force in the semiconductor market and impact all electronic products that are developed. PPA tradeoff decisions are not engineering decisions, but rather business decisions made by product companies as they decide to enter target end markets. As such, the sooner a company… Read More
Mitigating the Effects of DFE Error Propagation on High-Speed SerDes Links
As digital transmission speeds increase, designers use various techniques to improve the signal-to-noise ratio at the receiver output. One such technique is the Decision Feedback Equalizer (DFE) scheme, commonly used in high-speed Serializer-Deserializer (SerDes) circuits to mitigate the effects of channel noise and … Read More
Hardware Root of Trust for Automotive Safety
Traveling by car is something that I take for granted and I just expect that my trips will be safe, yet our cars are increasingly using dozens of ECUs, SoCs and millions of lines of software code that combined together present a target for hackers or system failures. The Automotive Safety Integrity Levels (ASIL) are known by the letters:… Read More
Siemens EDA on Managing Verification Complexity
Harry Foster is Chief Scientist in Verification at Siemens EDA and has held roles in the DAC Executive Committee over multiple years. He gave a lunchtime talk at DVCon on the verification complexity topic. He is an accomplished speaker and always has a lot of interesting data to share, especially his takeaways from the Wilson Research… Read More
Siemens Keynote Stresses Global Priorities
Dirk Didascalou, Siemens CTO, gave a keynote at DVCon, raising our perspective on why we do what we do. Yes, our work in semiconductor design enables the cloud and 5G and smart everything, but these technologies push progress for a select few. What about the big global concerns that affect us all: carbon, climate, COVID and conflict?… Read More
Calibre IC Manufacturing papers at SPIE 2023
The Siemens Calibre group was very busy last week at SPIE. Calling Calibre industry leading really is an understatement. Calibre is one of the reasons Moore’s Law has continued to this day. This tool is legendary. You can get more information on the Calibre landing page including product information, resource guide, blogs
The State of FPGA Functional Verification
Earlier I blogged about IC and ASIC functional verification, so today it’s time to round that out with the state of FPGA functional verification. The Wilson Research Group has been compiling an FPGA report every two years since 2018, so this marks the third time they’ve focused on this design segment. At $5.8 billion… Read More
Interconnect Choices for 2.5D and 3D IC Designs
A quick Google search for “2.5D 3D IC” returns 669,000 results, so it’s a popular topic for the semiconductor industry, and there are plenty of decisions to make, like whether to use an organic substrate or silicon interposer for interconnect of heterogenous semiconductor die. Design teams using 2.5D and … Read More