WP_Term Object
(
    [term_id] => 159
    [name] => Siemens EDA
    [slug] => siemens-eda
    [term_group] => 0
    [term_taxonomy_id] => 159
    [taxonomy] => category
    [description] => 
    [parent] => 157
    [count] => 757
    [filter] => raw
    [cat_ID] => 159
    [category_count] => 757
    [category_description] => 
    [cat_name] => Siemens EDA
    [category_nicename] => siemens-eda
    [category_parent] => 157
    [is_post] => 
)
            
Q2FY24TessentAI 800X100
WP_Term Object
(
    [term_id] => 159
    [name] => Siemens EDA
    [slug] => siemens-eda
    [term_group] => 0
    [term_taxonomy_id] => 159
    [taxonomy] => category
    [description] => 
    [parent] => 157
    [count] => 757
    [filter] => raw
    [cat_ID] => 159
    [category_count] => 757
    [category_description] => 
    [cat_name] => Siemens EDA
    [category_nicename] => siemens-eda
    [category_parent] => 157
    [is_post] => 
)

Getting Faster DRC Results with a New Approach

Getting Faster DRC Results with a New Approach
by Daniel Payne on 02-04-2025 at 10:00 am

Run time improvements using Calibre nmDRC Recon

As IC designs become increasingly complex, traditional Design Rule Checking (DRC) methods are struggling to keep up. The old “construct by correction” approach, initially developed for simpler, custom layouts, is creating substantial runtime and resource bottlenecks. Traditional DRC relies on an iterative, sequential… Read More


Full Spectrum Transient Noise: A must have sign-off analysis for silicon success

Full Spectrum Transient Noise: A must have sign-off analysis for silicon success
by Scott Guyton on 01-29-2025 at 10:00 am

Figure 1

Noise minimization is required for advanced analog and radiofrequency (RF) circuits. Unlike digital circuits, where noise is a second-order effect, system performance metrics such as signal-to-noise ratio (SNR), phase noise, timing jitter, and bit error rate (BER) are directly affected in analog and RF designs. Effective… Read More


PSS and UVM Work Together for System-Level Verification

PSS and UVM Work Together for System-Level Verification
by Bernard Murphy on 01-29-2025 at 6:00 am

System level testing min

In the early days of the PSS rollout, some verification engineers were suspicious. Just as they were beginning to get comfortable with UVM, here came yet another standard to add to their learning and complexity overhead. Then the fog started to clear; UVM is ideal for block-level testing whereas PSS is ideal for system level testing.… Read More


Heterogeneous 2D/3D Packaging Challenges

Heterogeneous 2D/3D Packaging Challenges
by Daniel Payne on 01-27-2025 at 10:00 am

Innovator3D IC flow min

A growing trend in system design is the use of multiple ICs mounted in advanced packages, especially in high-performance computing and AI. These modern packages now integrate multiple ICs, often with high-bandwidth memory (HBM), resulting in hundreds of thousands of connections that need proper verification. Traditional… Read More


Averting Hacks of PCIe® Transport using CMA/SPDM and Advanced Cryptographic Techniques

Averting Hacks of PCIe® Transport using CMA/SPDM and Advanced Cryptographic Techniques
by Kalar Rajendiran on 01-13-2025 at 10:00 am

CMA:SPDM Flow for Establishing a Secure Connection

In today’s digital landscape, data security has become an indispensable feature for any data transfer protocol, including Peripheral Component Interconnect Express (PCIe). With the rising frequency and sophistication of digital attacks, ensuring data integrity, confidentiality, and authenticity during PCIe transport… Read More


Reset Domain Crossing (RDC) Challenges

Reset Domain Crossing (RDC) Challenges
by Daniel Payne on 12-18-2024 at 10:00 am

Origin of reset trees

In the early days an IC had a single clock and a single reset signal, making it a simple matter to reset the chip into a known, stable state, so there was little need for detailed analysis. For modern designs there can be dozens to hundreds of clocks, creating separate domains and some use of asynchronous resets, so the challenge of ensuring… Read More


Electrical Rule Checking in PCB Tools

Electrical Rule Checking in PCB Tools
by Daniel Payne on 12-10-2024 at 10:00 am

HyperLynx DRC min

I’ve known about DRC (Design Rule Checking) for IC design, and the same approach can also be applied to PCB design. The continuous evolution of electronics has led to increasingly intricate PCB designs that require Electrical Rule Checking (ERC) to ensure that performance goals are met. This complexity poses several challenges… Read More


Innexis Product Suite: Driving Shift Left in IC Design and Systems Development

Innexis Product Suite: Driving Shift Left in IC Design and Systems Development
by Kalar Rajendiran on 12-03-2024 at 6:00 am

Full Spectrum Development Inexis Developer Pro

At the heart of the shift-left strategy is the goal of moving traditionally late-stage tasks—such as software development, validation, and optimization—earlier in the design process. This proactive approach allows teams to identify and resolve issues before they escalate, reducing costly rework and shortening the overall… Read More


Relationships with IP Vendors

Relationships with IP Vendors
by Daniel Nenni on 11-21-2024 at 10:00 am

Semiwiki Blog Post #3 Image #2

An animated panel discussion Design Automation Conference in June offered up a view of the state of RISC-V and open-source functional verification and a wealth of good material for a three-part blog post series.

Parts One and Two covered a range of topics from microcontroller versus more general-purpose processor versus running… Read More


Handling Objections in UVM Code

Handling Objections in UVM Code
by Daniel Payne on 11-18-2024 at 10:00 am

expanded view min

You begin writing some UVM code and there are parts of the code that aren’t done yet, so you begin to use uvm_objection, guarding that code. Rich Edelman, a product engineer at Siemens doing verification debug and analysis, wrote a paper on this topic, which I just read. This blog covers the topic of objections and provides some different… Read More