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Podcast EP323: How to Address the Challenges of 3DIC Design with John Ferguson

Podcast EP323: How to Address the Challenges of 3DIC Design with John Ferguson
by Daniel Nenni on 12-19-2025 at 10:00 am

Daniel is joined by John Ferguson, senior director of product management for the Calibre products in the 3DIC space at Siemens EDA. He manages the vision and product offerings in the Calibre domain for 3DIC design solutions.

Dan explores the challenges of 3DIC and chiplet-based design with John, who describes the broad range of… Read More


3D ESD verification: Tackling new challenges in advanced IC design

3D ESD verification: Tackling new challenges in advanced IC design
by Admin on 12-17-2025 at 10:00 am

fig1 3d structures

By Dina Medhat

Three key takeaways

  • 3D ICs require fundamentally new ESD verification strategies. Traditional 2D approaches cannot address the complexity and unique connections in stacked-die architectures.
  • Classifying external and internal IOs is essential for robust and cost-efficient ESD protection. Proper differentiation
Read More

Signal Integrity Verification Using SPICE and IBIS-AMI

Signal Integrity Verification Using SPICE and IBIS-AMI
by Daniel Payne on 12-15-2025 at 10:00 am

IBIS AMI min

High-speed signals enable electronic systems by using memory interfaces, SerDes channels, data center backplanes and connectivity in automobiles.  Challenges arise from signal distortions like inter-symbol interference, channel loss and dispersion effects. Multi-gigabit data transfer rates in High-Bandwidth Memory… Read More


Propelling DFT to New Levels of Coverage

Propelling DFT to New Levels of Coverage
by Bernard Murphy on 12-10-2025 at 6:00 am

Increase DFT coverage

Siemens recently released a white paper on a methodology to enhance test coverage for designs with tight DPPM requirements. I confess when I first skimmed the paper, I thought this was another spin on fault simulation for ASIL A-D qualification, but I was corrected and now agree that while there are some conceptual similarities… Read More


AI-Driven DRC Productivity Optimization: Insights from Siemens EDA’s 2025 TSMC OIP Presentation

AI-Driven DRC Productivity Optimization: Insights from Siemens EDA’s 2025 TSMC OIP Presentation
by Daniel Nenni on 12-09-2025 at 10:00 am

AI Driven DRC Productivity Optimization Siemens AMD TSMC

 

In the rapidly evolving semiconductor industry, Design Rule Checking (DRC) remains a critical bottleneck in chip design workflows. Siemens EDA’s presentation at the 2025 TSMC Open Innovation Platform Forum, titled “AI-Driven DRC Productivity Optimization,” showcases how artificial intelligence … Read More


An Assistant to Ease Your Transition to PSS

An Assistant to Ease Your Transition to PSS
by Bernard Murphy on 12-04-2025 at 6:00 am

PSS Assistant min

At times it has seemed like any development in EDA had to build a GenAI app that would catch the attention of Wall Street. Now I see more attention to GenAI being used for less glamorous but eminently more practical advances. This recent white paper from Siemens on how to help verification engineers get up to speed faster with PSS is … Read More


Accelerating SRAM Design Cycles: MediaTek’s Adoption of Siemens EDA’s Additive AI Technology at TSMC OIP 2025

Accelerating SRAM Design Cycles: MediaTek’s Adoption of Siemens EDA’s Additive AI Technology at TSMC OIP 2025
by Daniel Nenni on 12-02-2025 at 10:00 am

Siemens MediaTek TSMC OIP 2025

In the competitive vertical of mobile System-on-Chip development, SRAM plays a pivotal role, occupying nearly 40% of chip area and directly impacting yield and performance. The presentation “Accelerating SRAM Design Cycles With Additive AI Technology,” co-delivered by Mohamed Atoua of Siemens EDA and Deepesh… Read More


Transforming Functional Verification through Intelligence

Transforming Functional Verification through Intelligence
by Daniel Payne on 12-01-2025 at 10:00 am

Wilson Research Group, project schedule min

SoC projects are running behind schedule as design and verification complexity has increased dramatically, so just adding more engineers, more tests and more compute aren’t the answer. The time is ripe to consider smarter ways to improve verification efficiency. The added complexity of multiple embedded processors, multiple… Read More


Why chip design needs industrial-grade EDA AI

Why chip design needs industrial-grade EDA AI
by Admin on 11-25-2025 at 10:00 am

EDA AI consumer vs industrial 72dpi

By Niranjan Sitapure

Artificial intelligence (AI) is reshaping industries worldwide. Consumer-grade AI solutions are getting significant attention in the media for their creativity, speed, and accessibility—from ChatGPT and Meta’s AI app to Gemini for image creation, Sora for video, Sona for music, and Perplexity for web… Read More


Hierarchically defining bump and pin regions overcomes 3D IC complexity

Hierarchically defining bump and pin regions overcomes 3D IC complexity
by Admin on 11-13-2025 at 8:00 am

connectivity in a hierarchical IC package floorplan

By Todd Burkholder and Per Viklund, Siemens EDA

The landscape of advanced IC packaging is rapidly evolving, driven by the imperative to support innovation on increasingly complex and high-capacity products. The broad industry trend toward heterogeneous integration of diverse die and chiplets into advanced semiconductor… Read More