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WP_Term Object
(
    [term_id] => 19094
    [name] => Analytics
    [slug] => analytics
    [term_group] => 0
    [term_taxonomy_id] => 19094
    [taxonomy] => category
    [description] => 
    [parent] => 0
    [count] => 36
    [filter] => raw
    [cat_ID] => 19094
    [category_count] => 36
    [category_description] => 
    [cat_name] => Analytics
    [category_nicename] => analytics
    [category_parent] => 0
    [is_post] => 
)

proteanTecs at the 2025 Design Automation Conference

proteanTecs at the 2025 Design Automation Conference
by Daniel Nenni on 06-05-2025 at 8:00 am

62nd DAC SemiWiki

Discover how proteanTecs is transforming health and performance monitoring across the semiconductor lifecycle to meet the growing demands of AI and Next-Gen SoCs.

Stop by DAC booth #1616 to experience our latest technologies in action, including interactive live demos and explore our full suite of solutions — designed to boost… Read More


Leveraging Common Weakness Enumeration (CWEs) for Enhanced RISC-V CPU Security

Leveraging Common Weakness Enumeration (CWEs) for Enhanced RISC-V CPU Security
by Kalar Rajendiran on 05-13-2025 at 6:00 am

Information Flow Analysis Cycuity's Unique Approach

As RISC-V adoption accelerates across the semiconductor industry, so do the concerns about hardware security vulnerabilities that arise from its open and highly customizable nature. From hardware to firmware and operating systems, every layer of a system-on-chip (SoC) design must be scrutinized for security risks. Unlike… Read More


The Growing Importance of PVT Monitoring for Silicon Lifecycle Management

The Growing Importance of PVT Monitoring for Silicon Lifecycle Management
by Kalar Rajendiran on 04-24-2025 at 6:00 am

SLM IP Target Applications

In an era defined by complex chip architectures, ever-shrinking technology nodes and very demanding applications, Silicon Lifecycle Management (SLM) has become a foundational strategy for optimizing performance, reliability, and efficiency across the lifespan of a semiconductor device. Central to effective SLM are Process,… Read More


Cut Defects, Not Yield: Outlier Detection with ML Precision

Cut Defects, Not Yield: Outlier Detection with ML Precision
by Kalar Rajendiran on 03-20-2025 at 10:00 am

Part Average Testing

How much perfectly good silicon is being discarded in the quest for reliability? During high-volume chip manufacturing, aggressive testing with strict thresholds may ensure quality but reduces yield, discarding marginal chips that could function flawlessly. On the other hand, prioritizing yield risks allowing defective… Read More


2025 Outlook with Uzi Baruch of proteanTecs

2025 Outlook with Uzi Baruch of proteanTecs
by Daniel Nenni on 02-04-2025 at 6:00 am

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Tell us a little bit about yourself and your company. 

I am the Chief Strategy Officer at proteanTecs where I oversee our organic and inorganic growth strategies, as well as our go-to-market. This includes collaboration with ecosystem partners, defining our business model, and creating value for our customers through a targeted… Read More


Enhancing System Reliability with Digital Twins and Silicon Lifecycle Management (SLM)

Enhancing System Reliability with Digital Twins and Silicon Lifecycle Management (SLM)
by Kalar Rajendiran on 12-09-2024 at 6:00 am

Synopsys SLM Solution Components

As industries become more reliant on advanced technologies, the importance of ensuring the reliability and longevity of critical systems grows. Failures in components, whether in autonomous vehicles, high performance computing (HPC), healthcare devices, or industrial automation, can have far-reaching consequences.… Read More


Datacenter Chipmaker Achieves Power Reduction With proteanTecs AVS Pro

Datacenter Chipmaker Achieves Power Reduction With proteanTecs AVS Pro
by Kalar Rajendiran on 10-30-2024 at 10:00 am

Alphawave Using proTeanTechs

As semiconductor technology advances and nodes continue to shrink, designers are faced with increasing challenges related to device complexity, power consumption, and reliability. The delicate balance between high performance, low power usage, and long-term reliability is more critical than ever. This growing demand … Read More


Maximizing 3DIC Design Productivity with 3DBlox: A Look at TSMC’s Progress and Innovations in 2024

Maximizing 3DIC Design Productivity with 3DBlox: A Look at TSMC’s Progress and Innovations in 2024
by Kalar Rajendiran on 10-08-2024 at 10:00 am

3DFabric Silicon Validated Thermal Analysis

At the 2024 TSMC OIP Ecosystem Forum, one of the technical talks by TSMC focused on maximizing 3DIC design productivity and rightfully so. With rapid advancements in semiconductor technology, 3DICs have become the next frontier in improving chip performance, energy efficiency, and density. TSMC’s focus on streamlining the… Read More


Automating Reset Domain Crossing (RDC) Verification with Advanced Data Analytics

Automating Reset Domain Crossing (RDC) Verification with Advanced Data Analytics
by Kalar Rajendiran on 09-26-2024 at 10:00 am

RDC Verification using Data Analysis Techniques

The complexity of System-on-Chip (SoC) designs continues to rise at an accelerated rate, with design complexity doubling approximately every two years. This increasing complexity makes verification a more difficult and time-consuming task for design engineers. Among the key verification challenges is managing reset domain… Read More


proteanTecs Introduces a Safety Monitoring Solution #61DAC

proteanTecs Introduces a Safety Monitoring Solution #61DAC
by Mike Gianfagna on 08-01-2024 at 6:00 am

DAC Roundup – proteanTecs Introduces a Safety Monitoring Solution

At #61DAC it was quite clear that semiconductors have “grown up”. The technology has taken its place in the world as a mission-critical enabler for a growing list of industries and applications. Reliability and stability become very important as this change progresses. An error of failure  is somewhere between inconvenient… Read More