I recently had an eye-opening discussion regarding the phenomena of soft errors in semiconductor devices. I always knew this could be a problem in space, where there are all kinds of high energy particles. What I didn’t realize is there are two trends that are making this kind of problem relevant on the ground as well as in space. The… Read More
Issam Nofal is the CEO of IROC Technologies and has held various positions with the company for over 23 years as Product Manager, Project Leader, and R&D Engineer. He has authored several papers on test and reliability of Integrated Circuits. He holds a PhD in Microelectronics from Grenoble INP.
There are two ways to see how resistant your designs are to single-event errors (SEE). One is to take the chip or even the entire system and put it in a neutron beam and measure how many problems occur in this extreme environment. While that may be a necessary part of qualification in some very high reliability situations, it is also … Read More
As we have moved towards extremely low process nodes with very high chip density, the cost of mask preparation also has become exorbitantly high. It has become essential to know about the failure rates and mitigate the same at the design time before chip fabrication, and also to make sure about chip reliability over time as it is constantly… Read More
