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Fed up with ECOing your way out of test problems? You might want to register for this webinar.When you’re building monster SoC FPGAs, you have all the same problems you have with any other SoC. That includes getting to very high test coverage as quickly as you can with a design targeted to the most advanced processes. We’re not just … Read More
Design for test at RTLby Paul McLellan on 07-10-2011 at 3:09 pmCategories: EDA
Design for test (DFT) imposes various restrictions on the design so that the test automation tools (automatic test pattern approaches such as scan, as well as built-in self-test approaches) will subsequently be able to generate the test program. For example, different test approaches impose constraints on clock generation… Read More
