Delivering Zero Defect Products – EVS Testing

Delivering Zero Defect Products – EVS Testing
by Mark Rioux on 10-28-2015 at 12:00 pm

Competition in the semiconductor product marketplace has grown increasingly difficult as suppliers constantly search for ways to differentiate their products. Customers expect low cost, problem-free product performance. Automotive manufacturers in particular expect zero defects as field failures can prove very costly.… Read More


Test, The Forgotten Step-Child of Semiconductor Design

Test, The Forgotten Step-Child of Semiconductor Design
by Paul McLellan on 08-20-2013 at 7:56 pm

Somehow, when designing a chip it is synthesis and place & route that gets all the attention. But it is no good taping out perfect layout without also having away to test the silicon. Somehow, test just isn’t as glamorous.

On September 10-12th is the International Test Conference which, as usual, is at the Disneyland Hotel… Read More


Increasing Automotive Semiconductor Test Quality

Increasing Automotive Semiconductor Test Quality
by glforte on 06-17-2013 at 4:45 pm

The growing amount of electronics within today’s automobiles is driving very high quality and reliability requirements to a widening range of semiconductor devices. At the same time, traditional fault models are becoming less effective at achieving desired silicon quality levels. Improvements in test solutions are needed… Read More