The paper highlights how Fully Depleted Silicon-On-Insulator (FD-SOI) technology provides a robust defense against Laser Fault Injection (LFI), a precise, laboratory-grade attack method that can compromise cryptographic and safety-critical hardware. As vehicles become increasingly digital and connected, with dozens… Read More
Tag: PUFs
Synopsys Webinar: The Importance of Security in Multi-Die Designs – Navigating the Complex Landscape
In today’s rapidly evolving digital landscape, the security of electronic systems is of the highest priority. This importance is underscored by technological advancements and increasing regulatory demands. Multi-die designs which integrate multiple dies (also called chiplets) into a single package, introduce … Read More
[WEBINAR] Secure your devices with PUF plus hardware root-of-trust
It’s a hostile world we live in, and cybersecurity of connected devices is a big concern. Attacks are rising rapidly, and vulnerabilities get exploited immediately. Supply chains are complex. Regulations are proliferating. Secrets don’t stay secrets for long – in fact, the only secret in a system with open-source algorithms… Read More
CEO Interview: Pim Tuyls of Intrinsic ID
Pim Tuyls, CEO of Intrinsic ID, founded the company in 2008 as a spinout from Philips Research. It was at Philips, where he was Principal Scientist and managed the cryptography cluster, that he initiated the original work on Physical Unclonable Functions (PUFs) that forms the basis of the Intrinsic ID core technology. With more… Read More
