Today, an SoC is seen in the context of an optimized assembly of IPs; it’s no more a single monolithic chip design. It’s very common to see an ARM processor IP along with an interconnect IP, a memory IP, and couple of buses and interfaces IP in an SoC. Although the SoC seems to be an integrated collection of IPs, it can be very complex and… Read More
Tag: ppm
IC Test Sessions at SEMICON West 2012
SEMICON West is coming up this July 10-12 at the Moscone Center in San Francisco. It covers a broad swath of the microelectronics supply chain, but I was particularly interested in the test sessions. Here are two that I recommend.
“The Value of Test for Semiconductor Yield Learning” on Tuesday, July 10, at 1:30p. The… Read More