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New ERC Tools Catch Design Errorsby glforte on 02-11-2011 at 2:18 pmCategories: EDA, Siemens EDA
A growing number of reports highlight a class of design errors that is difficult to check using more traditional methods, and can potentially affect a wide range of IC designs, especially where high reliability is a must.By Matthew Hogan
Today’s IC designs are complex. They contain vast arrays of features and functionality in … Read More
