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Memory testing in the early days of computing was a relatively straightforward process. Designers relied on simple, deterministic approaches to verify the functionality of memory modules. However, as memory density increased and systems became more complex, the likelihood of faults also rose. With advancements in memory… Read More
In business we all have heard the maxim, “Time is Money.” I learned this lesson early on in my semiconductor career when doing DRAM design, discovering that the packaging costs and time on the tester were actually higher than the fabrication costs. System companies like IBM were early adopters of Design For Test (DFT)… Read More
