Evolution of Memory Test and Repair: From Silicon Design to AI-Driven Architectures

Evolution of Memory Test and Repair: From Silicon Design to AI-Driven Architectures
by Kalar Rajendiran on 04-01-2025 at 6:00 am

STAR Memory System (SMS) Solution

Memory testing in the early days of computing was a relatively straightforward process. Designers relied on simple, deterministic approaches to verify the functionality of memory modules. However, as memory density increased and systems became more complex, the likelihood of faults also rose. With advancements in memory… Read More