Electromigration and IR Drop Analysis has a New Entrant

Electromigration and IR Drop Analysis has a New Entrant
by Daniel Payne on 09-28-2021 at 9:00 am

mPower capacity

My first IR drop analysis was back in the early 1980s at Intel, where I had to manually model the parasitics of the VDD and VSS interconnect for all of the IO cells that our team was designing in a graphics chip, then I ran that netlist in a SPICE simulator using transient analysis, measuring the bounce in VSS and droop in VDD levels as all… Read More