Machine Learning in the Fab at #59DAC

Machine Learning in the Fab at #59DAC
by Daniel Payne on 09-14-2022 at 8:00 am

Virtual Metrology min

It used to be true that a foundry or fab would create a set of DRC files, provide them to designers, and then the process yield would be acceptable, however if the foundry knows more details about the physical implementation of IC designs then they can improve the yield. Using a digital twin of the design, process and metrology steps… Read More