Imec technology forum 2018 – the future of scaling

Imec technology forum 2018 – the future of scaling
by Scotten Jones on 06-27-2018 at 12:00 pm

At the Imec technology forum in Belgium, Dan Mocuta and Juliana Radu presented “Evolution and Disruption: A Perspective on Logic Scaling and Beyond”, I also had a chance to sit down with Dan and discuss the presentation.

Device scaling

Scaling of devices will only get you so far, you need to look at new devices and new… Read More


IEDM 2017 – Leti Gate-All-Around Stacked-Nanowires

IEDM 2017 – Leti Gate-All-Around Stacked-Nanowires
by Scotten Jones on 02-12-2018 at 12:00 pm

At IEDM in December I had a chance to interview Thomas Ernst about the paper “Performance and Design Considerations for Gate-All-around Stacked-NanoWires FETs” by Leti and STMicroelectonics.

Leti published the first stacked nanowire in 2006, it was very new then, now stacked nanowire/nanosheets are starting… Read More