IEDM 2019 to Highlight Innovative Devices for an Era of Connected Intelligence

IEDM 2019 to Highlight Innovative Devices for an Era of Connected Intelligence
by Scotten Jones on 08-28-2019 at 6:00 am

The IEEE International Electron Devices Meeting is in my opinion the leading technology conference to understand the current state-of-the-art in semiconductor process technology. Held each year in early December in San Francisco it is a must attend conference for anyone following technology development. The following is… Read More


Imec technology forum 2018 – the future of scaling

Imec technology forum 2018 – the future of scaling
by Scotten Jones on 06-27-2018 at 12:00 pm

At the Imec technology forum in Belgium, Dan Mocuta and Juliana Radu presented “Evolution and Disruption: A Perspective on Logic Scaling and Beyond”, I also had a chance to sit down with Dan and discuss the presentation.

Device scaling

Scaling of devices will only get you so far, you need to look at new devices and new… Read More


IEDM 2017 – Leti Gate-All-Around Stacked-Nanowires

IEDM 2017 – Leti Gate-All-Around Stacked-Nanowires
by Scotten Jones on 02-12-2018 at 12:00 pm

At IEDM in December I had a chance to interview Thomas Ernst about the paper “Performance and Design Considerations for Gate-All-around Stacked-NanoWires FETs” by Leti and STMicroelectonics.

Leti published the first stacked nanowire in 2006, it was very new then, now stacked nanowire/nanosheets are starting… Read More