On April 2 – 4, the 2019 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (FCMN) will be held at the Monterey Marriott in Monterey, CA. The 2019 FCMN is the 12th in the series that began in 1995 with a keynote talk by Craig Barrett, ex-CEO of Intel.… Read More