Transient Noise Analysis (TNA)

Transient Noise Analysis (TNA)
by Rupindermand on 04-29-2013 at 4:21 pm

Tanner EDA Applications Engineers see a broad range of technical challenges that our users are trying to overcome. Here’s one worth sharing – it deals with transient noise analysis (TNA) for a comparator design. The customer is a producer of advanced flow measurement devices for application in medicine and research. The designer… Read More


Static Timing Analysis for Memory Characterization

Static Timing Analysis for Memory Characterization
by Daniel Payne on 11-11-2012 at 6:18 pm

Modern SoC (System On Chip) designs contain a larger number of RAM (Random Access Memory) instances, so how do you know what the speed, timing and power are for any instance? There are a couple of approaches:
[LIST=1]

  • Trust the IP supplier to give you models that use polynomial equations to curve-fit the performance numbers based
  • Read More

    AMS Verification: Speed versus Accuracy

    AMS Verification: Speed versus Accuracy
    by Daniel Nenni on 10-03-2011 at 9:16 pm

    I spent Thursday Sept. 22 at the first nanometer Circuit Verification Forum, held at TechMart in Santa Clara. Hosted by Berkeley Design Automation (BDA), the forum was attended by 100+ people, with circuit designers dominating. I spoke with many attendees. They were seeking solutions to the hugely challenging problems they … Read More


    PVT and Statistical Design in Nanometer Process Geometries

    PVT and Statistical Design in Nanometer Process Geometries
    by Daniel Nenni on 09-18-2011 at 9:00 am

    On Sept 22, 2011, the nm Circuit Verification Forumwill be held in Silicon Valley, hosted by Berkeley Design Automation. At this forum, Trent McConaghy of Solido DA will present a case study on the TSMC Reference Flow 2.0 VCO circuit, to showcase Fast PVT in the steps of extracting PVT corners, verifying PVT, and doing post-layout… Read More