BDA Takes on FinFET-based Memories with AFS Mega

BDA Takes on FinFET-based Memories with AFS Mega
by Daniel Nenni on 05-29-2013 at 12:00 pm

Berkeley Design Automation today announced the first silicon-accurate circuit simulation for mega-scale arrays like memories and CMOS image sensors. If this tool lives up to its claims, it is going to be a big deal for FinFET-based circuits, Memory designers are rightly worried about having the accuracy necessary to include… Read More


Improving Design Practices for an Image Sensor IDM

Improving Design Practices for an Image Sensor IDM
by klujan on 05-07-2013 at 8:30 pm

With nearly twenty five years in business, Tanner EDA Application Engineers have seen a wide range of support requests. One consistent topic area is around design data management and design reuse. In one recent instance, our customer, an IDM who produces imaging sensors for infrared vision systems, called on Tanners AE team for… Read More


Hot Topic – CMOS Image Sensor Verification!

Hot Topic – CMOS Image Sensor Verification!
by Daniel Nenni on 04-29-2013 at 7:30 pm

Mobile applications require CMOS image sensor devices that have a low signal-to-noise ratio (SNR), low power, small area, high resolution, high dynamic range, and high frame rate. CMOS image sensor imaging performance is noise limited requiring accurate noise analysis on the pixel array electronics and column readout circuitry.… Read More


Transient Noise Analysis (TNA)

Transient Noise Analysis (TNA)
by Rupindermand on 04-29-2013 at 4:21 pm

Tanner EDA Applications Engineers see a broad range of technical challenges that our users are trying to overcome. Here’s one worth sharing – it deals with transient noise analysis (TNA) for a comparator design. The customer is a producer of advanced flow measurement devices for application in medicine and research. The designer… Read More


Static Timing Analysis for Memory Characterization

Static Timing Analysis for Memory Characterization
by Daniel Payne on 11-11-2012 at 6:18 pm

Modern SoC (System On Chip) designs contain a larger number of RAM (Random Access Memory) instances, so how do you know what the speed, timing and power are for any instance? There are a couple of approaches:
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  • Trust the IP supplier to give you models that use polynomial equations to curve-fit the performance numbers based
  • Read More

    AMS Verification: Speed versus Accuracy

    AMS Verification: Speed versus Accuracy
    by Daniel Nenni on 10-03-2011 at 9:16 pm

    I spent Thursday Sept. 22 at the first nanometer Circuit Verification Forum, held at TechMart in Santa Clara. Hosted by Berkeley Design Automation (BDA), the forum was attended by 100+ people, with circuit designers dominating. I spoke with many attendees. They were seeking solutions to the hugely challenging problems they … Read More


    PVT and Statistical Design in Nanometer Process Geometries

    PVT and Statistical Design in Nanometer Process Geometries
    by Daniel Nenni on 09-18-2011 at 9:00 am

    On Sept 22, 2011, the nm Circuit Verification Forumwill be held in Silicon Valley, hosted by Berkeley Design Automation. At this forum, Trent McConaghy of Solido DA will present a case study on the TSMC Reference Flow 2.0 VCO circuit, to showcase Fast PVT in the steps of extracting PVT corners, verifying PVT, and doing post-layout… Read More