Test and Diagnosis at ISTFA

Test and Diagnosis at ISTFA
by Beth Martin on 11-15-2012 at 7:10 pm

Finding and debugging failures on integrated circuits has become increasingly difficult. Two sessions at ISTFA (International Symposium for Testing and Failure Analysis) on Thursday address the current best practices and research directions of diagnosis.

The first was a tutorial this morning by Mentor Graphics luminary… Read More


IC Test Sessions at SEMICON West 2012

IC Test Sessions at SEMICON West 2012
by Beth Martin on 07-02-2012 at 1:43 pm

SEMICON West is coming up this July 10-12 at the Moscone Center in San Francisco. It covers a broad swath of the microelectronics supply chain, but I was particularly interested in the test sessions. Here are two that I recommend.

The Value of Test for Semiconductor Yield Learning” on Tuesday, July 10, at 1:30p. The… Read More


Formal Verification for Post-silicon Debug

Formal Verification for Post-silicon Debug
by Paul McLellan on 08-23-2011 at 5:52 pm

OK, let’s face it, when you think of post-silicon debug then formal verification is not the first thing that springs to mind. But once a design has been manufactured, debugging can be very expensive. As then-CEO of MIPS John Bourgoin said at DesignCon 2006, “Finding bugs in model testing is the least expensive and most desired… Read More