Scaling Multi-Die Connectivity: Automated Routing for High-Speed Interfaces

Scaling Multi-Die Connectivity: Automated Routing for High-Speed Interfaces
by Kalar Rajendiran on 03-23-2026 at 10:00 am

Bump maps for HBM PHY and HBM memory

This article concludes the three-part series examining key methodologies required for successful multi-die design. The first article Reducing Risk Early: Multi-Die Design Feasibility Exploration focused on feasibility exploration and early architectural validation, while the second article Building the InterconnectRead More


Statically Verifying RTL Connectivity with Synopsys

Statically Verifying RTL Connectivity with Synopsys
by Bernard Murphy on 10-15-2025 at 6:00 am

TestMAX Advisor Use Model min

Many years ago, not long after we first launched SpyGlass, I was looking around for new areas where we could apply static verification methods and was fortunate to meet Ralph Marlett, a guy (now friend) with extensive experience in DFT. Ralph joined us and went on to build the very capable SpyGlass DFT app. So capable that SpyGlass… Read More