During my trip through Asia last week I attended the Taiwan ESD Workshop. Hsinchu is densely populated with some of the smartest semiconductor people in the world so it is well worth the trip, absolutely. As it turns out ESD is one of the top concerns in semiconductor design and manufacture. The current rule based and simulation … Read More
Tag: CDMi
SemiWiki WEBINAR: Avoiding Charged Device Model ESD Failure
Failures during manufacturing and assembly or in the field caused by charged device model (CDM) type ESD events are a serious concern for IC design teams. CDM failures are generally caused by charge build-up on device packages, which capacitively charge large internet nets, such as GND or VSS. Once a device pin contacts a current… Read More