Predicting Lifetime of Analog ICs

Predicting Lifetime of Analog ICs
by Pawan Fangaria on 06-22-2015 at 12:30 pm

With the increase of transistors per unit area, high density interconnects and manufacturing variability at lower nodes, the electronic devices have become more vulnerable to failures. The devices that operate under extreme conditions such as automotive devices that operate at high temperatures need to be robust enough to… Read More


Kaufman Award: Chenming Hu

Kaufman Award: Chenming Hu
by Paul McLellan on 06-06-2013 at 3:44 am

This year’s Kaufman award winner is Chenming Hu. In contrast to previous years, this was presented on the Sunday evening of DAC instead of at a separate event in San Jose. Chenming’s career was reviewed by Klaus Schuegraf, Group Vice President of EUV Product Development at Cymer, Inc (now part of ASML) and also one of… Read More