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Whenever we push the bounds of reliability in any domain, we run into new potential sources of error. Perhaps not completely new, but rather concerns new to that domain. That’s the case for Single Event Upsets (SEUs) which are radiation-triggered bit-flips, and Single Event Transients (SETs) which are radiation-triggered pulses… Read More
Converge in Detroitby Paul McLellan on 09-30-2012 at 10:04 pmCategories: EDA, Synopsys
When I worked for VaST we went to a show that I’d never heard of in EDA: SAE Convergence (SAE is the Society of Automotive Engineers). It is held once every two years and it focuses on transportation electronics, primarily automotive although there did seem to be some aerospace stuff there too. This is an even year, Convergence… Read More
