Webinar: Electrical Rules Checking – How to Reduce Thousands of False Errors in 15 Minutes Using OneCheck Smart Clustering

Online

Analyzing electrical errors across an IP or a SoC at top level, can be a painful and long process, often requiring extensive setup time and hundred of hours to distinguish real issues from false positives. To address this challenge, Aniah developed OneCheck, a formal analysis tool capable of detecting 100% of electrical errors at the …

Webinar: Digital Twin for Multi-physics Systems – How to Verify and Optimize Performance at the Overall Product Level

Online

Ensuring reliable performance of products in the field requires verification and validation at the system level. This means considering the complex interaction of different physics between systems and sub-systems. In …

Webinar: Chip-Level Electromagnetic Crosstalk Signoff Using EMX Solver

Online

Description Today’s wireless and high-speed chip designs integrate an incredible amount of functionality on very small silicon real estate. Such integration requires optimization from the early stages of the design to post-layout vs. schematic (LVS) signoff. Increasingly complex designs and advanced process nodes test the limits of electromagnetic (EM) solvers in terms of modeling capacity …

Webinar: Enhancing Manufacturing Test Flows with Synopsys VC Z01X

Online

Leveraging functional patterns is crucial for achieving high defect coverage and reducing defective parts per million (DPPM) levels. Synopsys VC Z01X fault simulator offers enhanced fault coverage in manufacturing test flows, complementing ATPG tools like Synopsys TestMAX ATPG. In this presentation we will delve into unique coverage scenarios, such as resets and clocks blocked during ATPG mode. We'll …