Webinar: Accelerate time to success using smart methods for DFT chip architecture and validation

Online

Combining market-leading design-for-test (DFT) technologies with best-in-class netlist synthesis allows you to achieve DFT success more quickly. Many customers, including those for emulation and IC test, have challenges with scaling architectures. This webinar describes how Siemens emulation and silicon test solutions can work together to provide a smart DFT plug-and-play architecture for Veloce ICs. The …

Webinar: Chip-Level Electromagnetic Crosstalk Signoff Using EMX Solver

Online

Description Today’s wireless and high-speed chip designs integrate an incredible amount of functionality on very small silicon real estate. Such integration requires optimization from the early stages of the design to post-layout vs. schematic (LVS) signoff. Increasingly complex designs and advanced process nodes test the limits of electromagnetic (EM) solvers in terms of modeling capacity …