Defect-Based Testing

Munich, Germany

Semiconductor and integrated circuit developments continue to proceed at an incredible pace. For example, today's application-specific ICs and microprocessors can contain upwards of 100 million transistors. Traditional testing relies on the stuck-at-fault (SAF) to model defect behavior. Unfortunately, the SAF model is a poor model for defects. Other models and strategies are required to catch …

Webinar: Accelerating Complex RF Filter Design With AI-Powered Optimization

Online

Join us for this webinar to explore how Ansys SynMatrix, powered by AI-driven automation and HFSS integration, is transforming RF filter design by streamlining workflows, optimizing performance, and accelerating time-to-market. TIME: November 19, 2024 8am PST Venue: Virtual Overview RF engineers face increasingly complex design challenges. Higher operating frequencies, stringent performance requirements, and manufacturability hurdles …

Infineon’s GaN Roadshow

Infineon Technologies 198 Champion Court, San Jose, CA, United States

About Event Join us at the Infineon GaN Roadshow stop in San Jose to experience the future of power! This one-day symposium will dive deep into Infineon's Gallium Nitride power …