Failure and Yield Analysis is an increasingly difficult and complex process. Today, engineers are required to locate defects on complex integrated circuits. In many ways, this is akin to locating …
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DVCon is the premier conference on the application of languages, tools, and methodologies for the design and verification of electronic systems and integrated circuits. The focus of the conference is …
Making way for The IQ Era Much can happen in a year within our ecosystem of innovation and connectivity. As we build on the success of MWC25 and engage with MWC26 to activate a new theme …
The 22nd Annual Device Packaging Conference (DPC 2026) will be held in Phoenix, Arizona, on March 2-5, 2026. It is an international event organized by the International Microelectronics Assembly and …
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Product reliability and qualification continues to evolve with the electronics industry. New electronics applications require new approaches to reliability and qualification. In the past, reliability meant discovering, characterizing and modeling …
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GOMACTech (Government Microcircuit Applications & Critical Technology Conference) “Beyond the Noise” GOMACTech was established primarily to review developments in microcircuit applications for government systems. Established in 1968, the conference has …
Global platform for the embedded community The embedded world Exhibition&Conference provides a global platform and a place to meet for the entire embedded community, including leading experts, key players and …
For more than three decades, SNUG Silicon Valley has connected engineers, designers, and thought leaders with technical experts to network and share best practices for tackling design and verification challenges …
Explore the Ever-Expanding Optical Networking and Communications Industry Plenary Session Esteemed industry luminaries from Coherent, NVIDIA and Tesat-Spacecom will headline the event Tuesday, 17 March. These distinguished speakers will explore cutting-edge technologies, …
Electrical Overstress (EOS) and Electrostatic Discharge (ESD) account for most of the field failures observed in the electronics industry. Although EOS and ESD damage can at times look quite similar …
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NVIDIA GTC is the premier global AI conference, where developers, researchers, and business leaders come together to explore the next wave of AI innovation. From physical AI and AI factories …
Overview The 2026 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (FCMN) will be held at the Monterey Marriott in Monterey, CA from March 16-19, 2026. The FCMN will bring …
