Thursday, July 10, 2025 10:00am PDT | 1:00pm EDT | 19:00 CEST As AI revolutionizes industries, the demand for high-performance, low power computing intensifies, placing unprecedented requirements on data centers. This panel …
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For speaker and sponsorship opportunities please contact Malcolm About the Forum Obtain the latest industry outlook from proven industry gurus Listen to visionary presentations from leading industry semiconductor organisations Debate future industry challenges and markets Engage with other forum delegates, and develop new business relationships Enjoy Future Horizons' unmatched forum structure and hospitality International Electronics Forum brochure here Why Attend? It’s vertical … …
The 26th Korea Test Conference will be held at Suwon Convention Center on Monday, July 14, 2025. The Korea Semiconductor Testing Society holds a test conference every year to share …
Abstract As AI workloads increasingly dominate numerous cloud and edge applications, building a scalable, efficient, and future-ready AI chips is no longer optional—it's essential. This webinar explores the latest AI …
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POWERING INNOVATION THAT DRIVES HUMAN ADVANCEMENT Having the right solution at the right time can mean the difference between tabling thoughts or transforming industries. Ansys technologies put the power of innovation in your hands. Join us for a free global simulation event that is designed to inspire, equip and empower you to innovate. REGISTER HERE
The proliferation of cloud computing and artificial intelligence is driving significant performance improvements in data center processing. Unfortunately, the connections between these servers, and even the connections between the boards …
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*WORK EMAIL IS REQUIRED* As data volumes surge across cloud, AI, automotive, and edge systems, efficient lossless compression has become essential for meeting performance, latency, and bandwidth constraints. This webinar …
ABOUT US International Test Conference is the world's premier venue dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, design-for-test, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement. At ITC India, design, test, and yield professionals can …
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This course discusses the fundamentals of plasma assisted phenomena and reactive ion etching (RIE) processes. The emphasis is on the physical and chemical processes that determine the consequences of a …
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This online workshop introduces key concepts, tools, and techniques required for design and development using the AMD Vivado™ Design Suite for FPGAs, SoCs, and adaptive SoCs. The emphasis of this course is …
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Join processor IP experts from AKEANA as they explore why Simultaneous Multi-Threading (SMT) is becoming essential for next-generation SoC designs across AI, automotive, datacentre, and edge applications. This session unpacks …
Learn about Simulating Gate-All-Around Devices with Victory Atomistic As semiconductor devices push beyond FinFETs toward Gate-All-Around (GAA) architectures, accurate modeling at the nanoscale becomes essential. Join us for an in-depth …
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