yieldWerx is a US-based yield and data analytics company with over 15 years of experience supporting the semiconductor industry. Backed by a leadership and engineering team with decades of semiconductor expertise, the company delivers a semiconductor yield management platform designed to turn complex production data into actionable insights. The platform captures and integrates data from every stage of manufacturing, from wafer fabrication through final test, giving engineers and operations teams a unified view of product quality and performance. By consolidating data from wafer sort, final test, and assembly into a single repository, yieldWerx enables AI-driven pattern recognition, adaptive limit setting, and root-cause correlation across product lines and manufacturing sites, helping teams identify and resolve yield issues faster.
The company’s comprehensive and configurable software suite provides product and test engineers with the tools and technologies necessary to characterize new ICs and test programs, rapidly ramp up production at OSATs, and identify and diagnose yield excursions. Included in these modules is yieldWerx’s AI/ML-assisted Advanced PAT++ module (SPAT, DPAT, Multivariate PAT, GDBN, etc.), designed to help semiconductor manufacturers minimize yield loss, quickly identify process shifts, and gain greater control of their chip manufacturing processes.
yieldWerx serves customers of all sizes and across many industries from photonics and optical I/O, automotive, aerospace, and biomedical industries. Through efficient automation and intuitive reporting, our solution empowers Fabless, OSAT, and IDM operations to make smarter decisions, reduce waste, and enhance product reliability.
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