Improving Wafer Quality and Yield with UPW Resistivity and TOC Measurements

Improving Wafer Quality and Yield with UPW Resistivity and TOC Measurements
by Kalar Rajendiran on 12-04-2023 at 10:00 am

MT Group Stock Photo

An earlier SemiWiki post discussed water sustainability in semiconductor manufacturing, related challenges and solutions. Whether first time use or recycled use, water purity needs to meet certain stringent criteria for the processing task on hand. This article will look at it from a wafer quality and yield perspective and… Read More