Improving Wafer Quality and Yield with UPW Resistivity and TOC Measurements

Improving Wafer Quality and Yield with UPW Resistivity and TOC Measurements
by Kalar Rajendiran on 12-04-2023 at 10:00 am

MT Group Stock Photo

An earlier SemiWiki post discussed water sustainability in semiconductor manufacturing, related challenges and solutions. Whether first time use or recycled use, water purity needs to meet certain stringent criteria for the processing task on hand. This article will look at it from a wafer quality and yield perspective and… Read More


Executive Interview: Tony Casassa, General Manager of METTLER TOLEDO THORNTON

Executive Interview: Tony Casassa, General Manager of METTLER TOLEDO THORNTON
by Daniel Nenni on 11-03-2023 at 6:00 am

TC MT Thornton

Tony Casassa has served as the General Manager of METTLER TOLEDO THORNTON since 2015, after having joined the company in 2007 to lead the US Process Analytics business. Prior to spending the last 16 years with METTLER TOLEDO, Tony held various business leadership positions for 2 decades with Rohm and Haas Chemical. A common thread… Read More


Water Sustainability in Semiconductor Manufacturing: Challenges and Solutions

Water Sustainability in Semiconductor Manufacturing: Challenges and Solutions
by Kalar Rajendiran on 09-20-2023 at 10:00 am

Typical on line sensor monitoring points in the semiconductor industry

Water, the planet’s lifeblood, remains a finite and precious resource. The Earth’s total water supply has remained relatively constant over millennia. However, it is the uneven distribution of freshwater and the challenges of providing access to clean water that are causing stress in various parts of the world.… Read More