Hierarchically defining bump and pin regions overcomes 3D IC complexity

Hierarchically defining bump and pin regions overcomes 3D IC complexity
by Admin on 11-13-2025 at 8:00 am

connectivity in a hierarchical IC package floorplan

By Todd Burkholder and Per Viklund, Siemens EDA

The landscape of advanced IC packaging is rapidly evolving, driven by the imperative to support innovation on increasingly complex and high-capacity products. The broad industry trend toward heterogeneous integration of diverse die and chiplets into advanced semiconductor… Read More


Breaking out of the ivory tower: 3D IC thermal analysis for all

Breaking out of the ivory tower: 3D IC thermal analysis for all
by Admin on 08-26-2025 at 6:00 am

figure 1

Todd Burkholder and Andras Vass-Varnai, Siemens EDA

As semiconductor devices become smaller, more powerful and more densely integrated, thermal management has shifted from an afterthought to a central challenge in modern IC design. In contemporary 3D IC architectures—where multiple chiplets are stacked and closely arrayed—power… Read More