Each year at the International Test Conference(ITC) we hear about the latest advances from the testability side of both EDA vendors and academics. This year Aart de Geus, Chairman and Co-CEO of Synopsys delivered a keynote speech titled, “Testing Positive, for Complexity“. Yesterday I spoke with Robert Ruiz and… Read More
On my first job out of college as an IC design engineer I was surprised to discover that a major cost of chips was in the amount of time spent on the tester before being shipped. That is still true today, so how would you keep your tester time down, test coverage high and with a minimum number of pins when using multiple processors on a single… Read More
Every SOC that is designed must be tested and the premier conference for test is ITC, held last month in Anaheim, California.
I spoke with Robert Ruiz of Synopsys by phone on September 21st to get an update on what is new with EDA for test engineers this year. Robert and I first met back at Viewlogic when Sunrise was acquired in the 90’s.… Read More