In business we all have heard the maxim, “Time is Money.” I learned this lesson early on in my semiconductor career when doing DRAM design, discovering that the packaging costs and time on the tester were actually higher than the fabrication costs. System companies like IBM were early adopters of Design For Test (DFT)… Read More
Tag: test point insertion
Test Compression for Mission Critical SoCs
With the advent of the Internet-of-Things (IoT), Industry 4.0, Cognitive Computing, and autonomous vehicles and robots we are seeing an unprecedented number of systems-on-a-chip (SoCs) going into mission-critical applications. To accomplish the complexity of these applications, SoCs are being manufactured in leading-edge… Read More