Improvements in SRAM Yield Variation Analysis

Improvements in SRAM Yield Variation Analysis
by Tom Dillinger on 03-27-2016 at 12:00 pm

Image RemovedThe design of an SRAM array requires focus on the key characteristics of readability, writeability, and read stability. As technology scaling has enabled the integration of large (cache) arrays on die, the sheer number of bitcells has necessitated a verification methodology that focuses on “statistical high-sigma… Read More