All-Digital In-Memory Computing

All-Digital In-Memory Computing
by Tom Dillinger on 03-15-2021 at 6:00 am

NOR gate

Research pursuing in-memory computing architectures is extremely active.  At the recent International Solid State Circuits conference (ISSCC 2021), multiple technical sessions were dedicated to novel memory array technologies to support the computational demand of machine learning algorithms.

The inefficiencies associated… Read More


Improvements in SRAM Yield Variation Analysis

Improvements in SRAM Yield Variation Analysis
by Tom Dillinger on 03-27-2016 at 12:00 pm

The design of an SRAM array requires focus on the key characteristics of readability, writeability, and read stability. As technology scaling has enabled the integration of large (cache) arrays on die, the sheer number of bitcells has necessitated a verification methodology that focuses on “statistical high-sigma” variation… Read More