Increase Your Chip Reliability with iROC Tech

Increase Your Chip Reliability with iROC Tech
by Pawan Fangaria on 06-12-2013 at 9:00 pm

As we have moved towards extremely low process nodes with very high chip density, the cost of mask preparation also has become exorbitantly high. It has become essential to know about the failure rates and mitigate the same at the design time before chip fabrication, and also to make sure about chip reliability over time as it is constantly… Read More


SOCFIT, Circuit Level Soft Error Analysis

SOCFIT, Circuit Level Soft Error Analysis
by Paul McLellan on 05-13-2013 at 2:50 pm

I blogged recently about reliability testing with high energy neutron beams. This is good for getting basic reliability data but it is not really a useful tool for worrying about reliability while the chip is still being designed and something can be done about it.

That is where IROC Technologies SOCFIT tool comes in. It takes all… Read More