Issam Nofal is the CEO of IROC Technologies and has held various positions with the company for over 23 years as Product Manager, Project Leader, and R&D Engineer. He has authored several papers on test and reliability of Integrated Circuits. He holds a PhD in Microelectronics from Grenoble INP.
As we have moved towards extremely low process nodes with very high chip density, the cost of mask preparation also has become exorbitantly high. It has become essential to know about the failure rates and mitigate the same at the design time before chip fabrication, and also to make sure about chip reliability over time as it is constantly… Read More
I blogged recently about reliability testing with high energy neutron beams. This is good for getting basic reliability data but it is not really a useful tool for worrying about reliability while the chip is still being designed and something can be done about it.
That is where IROC Technologies SOCFIT tool comes in. It takes all… Read More
