Cut Defects, Not Yield: Outlier Detection with ML Precision

Cut Defects, Not Yield: Outlier Detection with ML Precision
by Kalar Rajendiran on 03-20-2025 at 10:00 am

Part Average Testing

How much perfectly good silicon is being discarded in the quest for reliability? During high-volume chip manufacturing, aggressive testing with strict thresholds may ensure quality but reduces yield, discarding marginal chips that could function flawlessly. On the other hand, prioritizing yield risks allowing defective… Read More