From Process Learning to Production Control: Characterization for the Era of Heterogeneous Systems

From Process Learning to Production Control: Characterization for the Era of Heterogeneous Systems
by Kalar Rajendiran on 07-27-2026 at 6:00 am

Chiplets Have Changed the Test Paradigm

Every generation of semiconductor innovation has relied on one fundamental principle: before a technology can be manufactured at scale, it must first be understood. That understanding comes through characterization.

For decades, characterization enabled process learning. It helped engineers understand transistor behavior,… Read More