New Product for In-System Test

New Product for In-System Test
by Daniel Payne on 11-05-2024 at 8:00 am

Failure rates over time

The annual ITC event is happening this week in San Diego as semiconductor test professionals gather from around the world to discuss their emerging challenges and new approaches, so last week I had the opportunity to get an advance look at something new from Siemens named Tessent In-System Test software. Jeff Mayer, Product Manager,… Read More


Design For Safety in Automotive Electronics

Design For Safety in Automotive Electronics
by Daniel Payne on 08-11-2015 at 12:00 pm

Do you remember how auto maker Toyota had to pay a $1.2 billion settlement in 2014 because some of their automotive models experienced sudden, unintended acceleration? That scenario has to be an engineer’s worst nightmare because something was missed during the design and testing of an automotive electronics system that… Read More