Accelerating NPI with Deep Data: From First Silicon to Volume

Accelerating NPI with Deep Data: From First Silicon to Volume
by Kalar Rajendiran on 12-03-2025 at 10:00 am

proteanTecs Multi Pillar Technology

For decades, semiconductor teams have relied on traditional methods such as corner-based analysis, surrogate monitors, and population-level statistical screening for post-silicon validation. These methods served well when variability was modest, and timing paths behaved predictably. However, today’s advanced nodes… Read More