IEEE International Conference on PHYSICAL ASSURANCE and INSPECTION of ELECTRONICS (PAINE)

IEEE International Conference on PHYSICAL ASSURANCE and INSPECTION of ELECTRONICS (PAINE)
by Admin on 12-18-2023 at 9:54 pm

About PAINE

Physical inspection of electronics has grown significantly over the past decade and is becoming a major focus for the chip designers, original equipment manufacturers, and system developers. The complex long life of the electronic devices coupled with their diverse applications is making them increasingly vulnerable

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IEEE International Conference on PHYSICAL ASSURANCE and INSPECTION of ELECTRONICS (PAINE)

IEEE International Conference on PHYSICAL ASSURANCE and INSPECTION of ELECTRONICS (PAINE)
by Admin on 09-25-2023 at 3:51 pm

About PAINE

Physical inspection of electronics have grown significantly over the past decade and is becoming a major focus for the chip designers, original equipment manufacturers, and system developers. The complex long life of the electronic devices coupled with their diverse applications are making them increasingly

Read More

KLA Blows Away Competition in the Semiconductor Metrology/Inspection Market

KLA Blows Away Competition in the Semiconductor Metrology/Inspection Market
by Robert Castellano on 02-18-2020 at 10:00 am

KLA Blows Away CompetitionC1

KLA saw its share of the semiconductor metrology/inspection market increase from 52% in 2018 to 56% in 2019.

As a background, KLA manufactures and sells equipment used to monitor many of the 400 to 600 processing steps in the manufacturing of semiconductors, starting with a bare wafer, such as silicon, to a completed device. The… Read More