Catching IC Manufacturing Defects With Slack-Based Transition Delay Testing

Catching IC Manufacturing Defects With Slack-Based Transition Delay Testing
by Daniel Payne on 07-16-2014 at 3:00 pm

Test engineers are often the unsung heroes in the semiconductor world, because they have the tough job of deciding if each IC is good or bad, while taking the least amount of time on a tester and ensuring that the tests are actually finding and uncovering all manufacturing and process variation defects. Simple stuck-at fault models… Read More