Electromigration (EM) with an Electrically-Aware IC Design Flow

Electromigration (EM) with an Electrically-Aware IC Design Flow
by Daniel Payne on 11-03-2012 at 4:05 pm

fig2a

Electromigration (EM) is a reliability concern for IC designers because a failure in the field could spell disaster as in lost human life or even bankruptcy for a consumer electronics company. In the old days of IC design we would follow a sequential and iterative design process of:… Read More