HBM’s Second Act: When Memory Starts Thinking

HBM’s Second Act: When Memory Starts Thinking
by Admin on 09-08-2026 at 2:00 pm

HBM Base Die Revolution

Samsung’s Hot Chips 2026 presentation, “HBM Base Die: How HBM Will Evolve Using Advanced Logic Processes,” argues that the base die beneath a High Bandwidth Memory stack is about to become far more than a communications layer. Traditionally, an HBM base die mainly connects stacked DRAM dies to a GPU, TPU, or other processor and … Read More


cHBM for AI: Capabilities, Challenges, and Opportunities

cHBM for AI: Capabilities, Challenges, and Opportunities
by Kalar Rajendiran on 07-31-2025 at 6:00 am

cHBM Panelists at Synopsys Executive Forum

AI’s exponential growth is transforming semiconductor design—and memory is now as critical as compute. Multi-die architecture has emerged as the new frontier, and custom High Bandwidth Memory (cHBM) is fast becoming a cornerstone in this evolution. In a panel session at the Synopsys Executive Forum, leaders from AWS, Marvell,… Read More


Synopsys Executive Forum: Driving Silicon and Systems Engineering Innovation

Synopsys Executive Forum: Driving Silicon and Systems Engineering Innovation
by Kalar Rajendiran on 04-09-2025 at 10:00 am

Sassine Keynote (with Satya)

The annual SNUG (Synopsys Users Group) conference, now in its 35th year, once again brought together key stakeholders to showcase accomplishments, discuss challenges, and explore opportunities within the semiconductor and electronics industry. With approximately 2,500 attendees, SNUG 2025 served as a dynamic hub for collaboration… Read More


Evolution of Memory Test and Repair: From Silicon Design to AI-Driven Architectures

Evolution of Memory Test and Repair: From Silicon Design to AI-Driven Architectures
by Kalar Rajendiran on 04-01-2025 at 6:00 am

STAR Memory System (SMS) Solution

Memory testing in the early days of computing was a relatively straightforward process. Designers relied on simple, deterministic approaches to verify the functionality of memory modules. However, as memory density increased and systems became more complex, the likelihood of faults also rose. With advancements in memory… Read More