Tag: calibration

Webinar: ML-Enhanced TCAD Calibration With 10x Reduction in Time to Results

Webinar: ML-Enhanced TCAD Calibration With 10x Reduction in Time to Results
by Admin on 09-30-2025 at 12:14 am

Date: Oct 15, 2025 | 5:00 PM PST

Featured Speakers:

  • Saurabh Suryavanshi, Product Manager, Synopsys
  • Youngkwon Cho, Senior Staff Engineer, Synopsys
  • Dipanjan Basu, Principal Engineer, Synopsys

Calibration is an essential part of enabling TCAD products usages inside Semiconductor fab. Synopsys has been leading the development

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Can Correlation Between Simulation and Measurement be Achieved for Advanced Designs?

Can Correlation Between Simulation and Measurement be Achieved for Advanced Designs?
by Mike Gianfagna on 03-18-2024 at 6:00 am
Categories: Events, Samtec, Semiconductor Services

Can Correlation Between Simulation and Measurement be Achieved for Advanced Designs?

“What you simulate is what you get.” This is the holy grail of many forms of system design. Achieving a high level of accuracy between predicted and actual performance can cut design time way down, resulting in better cost margins, time to market and overall success rates. Achieving a high degree of confidence in predicted performance… Read More

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SMART sensors with OTP memory for the IIoT

SMART sensors with OTP memory for the IIoT
by Don Dingee on 07-25-2016 at 4:00 pm
Categories: IoT, IP, Security, Sidense

A few years back before IoT became the buzzword, the industrial automation community had already talking about “smart sensors” since the mid-1990s. The impetus for those discussions was IEEE 1451, a family of standards for adding intelligence and wireless communications to sensors so they could be incorporated into field networks.… Read More