Cut Defects, Not Yield: Outlier Detection with ML Precision

Cut Defects, Not Yield: Outlier Detection with ML Precision
by Kalar Rajendiran on 03-20-2025 at 10:00 am

Part Average Testing

How much perfectly good silicon is being discarded in the quest for reliability? During high-volume chip manufacturing, aggressive testing with strict thresholds may ensure quality but reduces yield, discarding marginal chips that could function flawlessly. On the other hand, prioritizing yield risks allowing defective… Read More


What are Cloud Flight Plans? Cost-effective use of cloud resources for leading-edge semiconductor design

What are Cloud Flight Plans? Cost-effective use of cloud resources for leading-edge semiconductor design
by Christopher Clee on 08-19-2024 at 10:00 am

fig1 vpc

Embracing cloud computing is highly attractive for users of electronic design automation (EDA) tools and flows because of the productivity gains and time to market advantages that it can offer. For Siemens EDA customers engaged in designing large, cutting-edge chips at advanced nanometer scales, running Calibre® design stage… Read More